Guided wave ∂n/∂T measurements for narrow-bandpass filters

E. Drouard; P. Huguet-Chantôme; L. Escoubas; F. Flory

doi:10.1364/OIC.2001.TuD7

Optical Interference Coatings
OSA Technical Digest Series (Optica Publishing Group, 2001),
paper TuD7
•https://doi.org/10.1364/OIC.2001.TuD7

Guided wave ∂n/∂T measurements for narrow-bandpass filters

E. Drouard, P. Huguet-Chantôme, L. Escoubas, and F. Flory

Optical Interference Coatings 2001

Banff Canada
ISBN: 1-55752-682-6

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Characterization of Optical Coatings I (TuD)

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E. Drouard, P. Huguet-Chantôme, L. Escoubas, and F. Flory, "Guided wave ∂n/∂T measurements for narrow-bandpass filters," in Optical Interference Coatings, OSA Technical Digest Series (Optica Publishing Group, 2001), paper TuD7.

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Abstract

∂n/∂T measurements of thin films with the m-lines technique are presented. Consequently, the wavelength shift of an interference filter is theoretically and experimentally studied. The theoretical wavelength shift of a DWDM filter is discussed.

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