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Conferences > OIC > 2004 > WB > WB8

Interaction between a guided mode and a surface nano defect

Javier Durán-Favela, Jorge Gaspar-Armenta, Raúl García-Llamas, and José Valenzuela-Benavides

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Abstract

The electromagnetic near-field produced by the interaction between a transverse electric guided mode and a surface nano-defect in a planar structure is studied. A Fourier Transform technique is used to obtain the surface defect profile.

© 2004 Optical Society of America

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