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Conference Paper
Optical Interference Coatings
Tucson, Arizona United States
June 3, 2007
ISBN: 1-55752-841-1
Filters (TuD)

Implementation of Long-Wavelength Cut-off Filters Based on Critical Angle

J. A. Dobrowolski, Yanen Guo, Li Li, and Tom Tiwald

http://dx.doi.org/10.1364/OIC.2007.TuD2


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Abstract

We describe the practical problems that need to be overcome when constructing long-wavelength cut-off filters with extended transmission and rejection regions based on the use of critical angle and the dispersion of refractive indices.

© 2007 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2440) Instrumentation, measurement, and metrology : Filters
(260.0260) Physical optics : Physical optics
(260.2030) Physical optics : Dispersion

Citation
J. A. Dobrowolski, Y. Guo, L. Li, and T. Tiwald, " Implementation of Long-Wavelength Cut-off Filters Based on Critical Angle," in Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), paper TuD2.
http://www.opticsinfobase.org/abstract.cfm?URI=OIC-2007-TuD2


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