Ultrafast Near Edge X-ray Absorption Measurement of the Insulator-to-metal Transition in VO2

A. Cavalleri; A. Cavalleri; H.H.W. Chong; H.H.W. Chong; S. Fourmaux; S. Fourmaux; T.E. Glover; T.E. Glover; P.A. Heimannn; P.A. Heimannn; J.C. Kieffer; J.C. Kieffer; H.A. Padmore; H.A. Padmore; R.W. Schoenlein; R.W. Schoenlein

14th International Conference on Ultrafast Phenomena
Technical Digest (CD) (Optica Publishing Group, 2004),
paper WC5

Ultrafast Near Edge X-ray Absorption Measurement of the Insulator-to-metal Transition in VO₂

A. Cavalleri, H.H.W. Chong, S. Fourmaux, T.E. Glover, P.A. Heimannn, J.C. Kieffer, H.A. Padmore, and R.W. Schoenlein

International Conference on Ultrafast Phenomena 2004

Niigata Japan
25–30 July 2004
ISBN: 3-54024-110-8

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A. Cavalleri, H. H. W. Chong, S. Fourmaux, T. E. Glover, P. A. Heimannn, J. C. Kieffer, H. A. Padmore, and R. W. Schoenlein, "Ultrafast Near Edge X-ray Absorption Measurement of the Insulator-to-metal Transition in VO2," in 14th International Conference on Ultrafast Phenomena, Technical Digest (CD) (Optica Publishing Group, 2004), paper WC5.

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Abstract

We measure the insulator-to-metal transition in VO₂ using time-resolved Near-Edge X-ray Absorption. Picosecond pulses of synchrotron radiation are used to detect the red-shift in the Vanadium L3 edge at 516 eV, associated with bandgap collapse.

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