Ultrafast ellipsometry and transient absorption spectroscopies are used to measure material dynamics under extreme conditions of temperature, pressure, and volumetric compression induced by shock wave loading with a chirped, spectrally clipped shock drive pulse.
© 2010 OSA
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(300.0300) Spectroscopy : Spectroscopy
(300.6250) Spectroscopy : Spectroscopy, condensed matter
S. McGrane, C. Bolme, V. Whitley, and D. Moore, "Ultrafast Dynamic Ellipsometry and Spectroscopies of Laser Shocked Materials," in International Conference on Ultrafast Phenomena, OSA Technical Digest (CD) (Optical Society of America, 2010), paper ThE44.
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