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Conference Paper
International Conference on Ultrafast Phenomena
Snowmass Village, Colorado United States
July 18-23, 2010
ISBN: 978-1-55752-894-0
Poster Session III (ThE)

Ultrafast Dynamic Ellipsometry and Spectroscopies of Laser Shocked Materials

Shawn McGrane, Cynthia Bolme, Von Whitley, and David Moore

http://dx.doi.org/10.1364/UP.2010.ThE44


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Abstract

Ultrafast ellipsometry and transient absorption spectroscopies are used to measure material dynamics under extreme conditions of temperature, pressure, and volumetric compression induced by shock wave loading with a chirped, spectrally clipped shock drive pulse.

© 2010 OSA

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(300.0300) Spectroscopy : Spectroscopy
(300.6250) Spectroscopy : Spectroscopy, condensed matter

Citation
S. McGrane, C. Bolme, V. Whitley, and D. Moore, "Ultrafast Dynamic Ellipsometry and Spectroscopies of Laser Shocked Materials," in International Conference on Ultrafast Phenomena, OSA Technical Digest (CD) (Optical Society of America, 2010), paper ThE44.
http://www.opticsinfobase.org/abstract.cfm?URI=UP-2010-ThE44


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