Abstract

An integrating sphere for transmittance measurements at normal and oblique angles of incidence has been constructed. The sphere is a single-beam instrument that uses a small-area silicon diode as the detector. The entry port is only 0.37% of the total wall area and has an oblong shape to permit measurements at high angles of incidence for scattering samples. A small beam size has been made possible by using a low-noise preamplifier system for the detector circuit. The oblong port shape and a small beam size make it possible to perform simulated double-beam measurements at near-normal incidence. Modified correction factors for the sample reflectance have been derived. Special attention has been paid to the separation into a diffuse and a specular component of the transmitted light. Results have been compared with the results of measurements on a double-beam instrument, and the correction factors for specular and diffuse samples have been experimentally verified. The importance of using the right correction factors for different types of samples has been evaluated together with the influence of the sphere parameters.

© 1994 Optical Society of America

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