Abstract

Confocal microscopy was initially developed to image complex circuits and material defects. Previous imaging studies yielded only qualitative data about the location and number of defects. In the present study, this noninvasive method is used to obtain quantitative information about the Q factor of an optical resonant cavity. Because the intensity of the fluorescent signal measures the number of defects in the resonant cavity, this signal is a measure of the number of surface scattering defects, one of the dominant loss mechanisms in optical microcavities. The Q of the cavities was also determined using conventional linewidth measurements. Based upon a quantitative comparative analysis of these two techniques, it is shown that the Q can be determined without a linewidth measurement, allowing for a noninvasive characterization technique.

© 2008 Optical Society of America

Upconversion fiber-optic confocal microscopy under near-infrared pumping

Do-Hyun Kim, Jin U. Kang, and Ilko K. Ilev
Opt. Lett. 33(5) 425-427 (2008)

Heavy water detection using ultra-high-Q microcavities

Andrea M. Armani and Kerry J. Vahala
Opt. Lett. 31(12) 1896-1898 (2006)

High-speed electro-optic control of the optical quality factor of a silicon microcavity

Sasikanth Manipatruni, Carl B. Poitras, Qianfan Xu, and Michal Lipson
Opt. Lett. 33(15) 1644-1646 (2008)

Confocal diffraction phase microscopy of live cells

Niyom Lue, Wonshik Choi, Kamran Badizadegan, Ramachandra R. Dasari, Michael S. Feld, and Gabriel Popescu
Opt. Lett. 33(18) 2074-2076 (2008)

Tailoring the behavior of optical microcavities with high refractive index sol-gel coatings

Ashley J. Maker, Brian A. Rose, and Andrea M. Armani
Opt. Lett. 37(14) 2844-2846 (2012)