Single-element objective lens for soft x-ray differential interference contrast microscopy
Optics Letters, Vol. 31, Issue 10, pp. 1564-1566 doi:10.1364/OL.31.001564
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- OCIS Codes:
- (050.5080) Diffraction and gratings : Phase shift
- (070.2580) Fourier optics and signal processing : Paraxial wave optics
- (160.3820) Materials : Magneto-optical materials
- (340.7460) X-ray optics : X-ray microscopy
X-ray Optics
Citation
Chang Chang, Anne Sakdinawat, Peter Fischer, Erik Anderson, and David Attwood, "Single-element objective lens for soft x-ray differential interference contrast microscopy," Opt. Lett. 31, 1564-1566 (2006)
http://www.opticsinfobase.org/abstract.cfm?URI=ol-31-10-1564
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High-resolution soft x-ray differential interference contrast (DIC) imaging was demonstrated through the use of a single-element objective, the XOR pattern, in a full-field soft x-ray microscope. DIC images of the magnetic domains in a 59 nm thick amorphous Gd25Fe75 layer were obtained and magnetic phase contributions were directly imaged. With its elemental, chemical, and magnetic specificity, compatibility with various sample environments, and ease of implementation, we expect this soft x-ray DIC technique to become one of the standard modes of operation for existing full-field soft x-ray microscopes.
© 2006 Optical Society of America
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History
Original Manuscript: February 1, 2006
Manuscript Accepted: February 13, 2006
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Author Affiliations
Drexel University
Lawrence Berkeley National Laboratory
University of California
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