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Conference Paper
Advances in Photorefractive Materials, Effects and Devices
Elsinore Denmark
June 27, 1999
ISBN: 1-55752-606-0
Materials and Characterization (MC)

Polarization self-modulation effect as a method for the estimation of material parameters of photorefractive crystals

Erik Raita, Alexei A. Kamshilin, Kimmo Paivasaari, Victor V. Prokofiev, and Timo Jaaskelainen

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No abstract available.

OCIS Codes
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry
(190.5330) Nonlinear optics : Photorefractive optics

Citation
E. Raita, A. A. Kamshilin, K. Paivasaari, V. V. Prokofiev, and T. Jaaskelainen, "Polarization self-modulation effect as a method for the estimation of material parameters of photorefractive crystals," in Advances in Photorefractive Materials, Effects and Devices, P. Andersen, P. Johansen, H. Pedersen, P. Petersen, and M. Saffman, eds., Vol. 27 of Trends in Optics and Photonics (Optical Society of America, 1999), paper MC4.
http://www.opticsinfobase.org/abstract.cfm?URI=APMED-1999-MC4

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