Abstract
We report a method based on Malus law to directly measure the dielectric frame orientation of monoclinic crystals with an accuracy of 0.3°. It was validated by the study of Nd3+:YCa4O(BO3)3, Sn2P2S6, BiB3O6 and Eu3+:Y2SiO5.
© 2014 Optical Society of America
PDF ArticleMore Like This
P. Loiko, P. L. Inácio, P. Segonds, A. Peña, J. Debray, S. Douillet, C. Félix, B. Boulanger, D. Rytz, K. Yumashev, V. Filippov, S. Guretsky, X. Mateos, and M. C. Pujol
CE_P_13 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2015
Pavel Loiko, Patricia Segonds, Patricia Loren Inácio, Alexandra Peña, Jérôme Debray, Daniel Rytz, Valery Filippov, Konstantin Yumashev, Maria Cinta Pujol, Xavier Mateos, Magdalena Aguiló, Francesc Díaz, Marc Eichhorn, and Benoit Boulanger
AM3A.5 Advanced Solid State Lasers (ASSL) 2016
K. M. Dinndorf, D. S. Knowles, M. Gojer, C. J. Taylor, and H. P. Jenssen
LM1 Advanced Solid State Lasers (ASSL) 1992