Two different schemes using femtosecond lasers for optical frequency metrology without the use of nonlinear fiber are experimentally demonstrated, allowing phase coherence between the microwave, visible, and infrared portions of the electromagnetic spectrum.
© 2005 Optical Society of America
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(320.0320) Ultrafast optics : Ultrafast optics
(320.7160) Ultrafast optics : Ultrafast technology
S. M. Foreman, A. Marian, J. Ye, E. A. Petrukhin, M. A. Gubin, O. D. Mucke, F. N. c. Wong, E. P. Ippen, and F. X. Kaertner, "Ti:Sapphire Lasers for Frequency Metrology Spanning the Visible and Infrared Spectrum without Nonlinear Fiber," in Advanced Solid-State Photonics, Technical Digest (Optical Society of America, 2005), paper WB30.
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