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Conference Paper
Advanced Solid-State Photonics
Vienna Austria
February 6, 2005
ISBN: 1-55752-781-4
Young Scientist Poster Session (WB)

Ti:Sapphire Lasers for Frequency Metrology Spanning the Visible and Infrared Spectrum without Nonlinear Fiber

Seth M. Foreman, Adela Marian, Jun Ye, Evgeny A. Petrukhin, Mikhail A. Gubin, Oliver D. Mucke, Franco N. c. Wong, Erich P. Ippen, and Franz X. Kaertner

http://dx.doi.org/10.1364/ASSP.2005.WB30


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Abstract

Two different schemes using femtosecond lasers for optical frequency metrology without the use of nonlinear fiber are experimentally demonstrated, allowing phase coherence between the microwave, visible, and infrared portions of the electromagnetic spectrum.

© 2005 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(320.0320) Ultrafast optics : Ultrafast optics
(320.7160) Ultrafast optics : Ultrafast technology

Citation
S. M. Foreman, A. Marian, J. Ye, E. A. Petrukhin, M. A. Gubin, O. D. Mucke, F. N. c. Wong, E. P. Ippen, and F. X. Kaertner, "Ti:Sapphire Lasers for Frequency Metrology Spanning the Visible and Infrared Spectrum without Nonlinear Fiber," in Advanced Solid-State Photonics, Technical Digest (Optical Society of America, 2005), paper WB30.
http://www.opticsinfobase.org/abstract.cfm?URI=ASSP-2005-WB30


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