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Improved Imaging Property of the Scanning Total Internal Reflection Fluorescence Microscope by the Use of Optimally Polarized Illumination

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Abstract

We report on an improvement of an imaging property in the two-photon excited total internal reflection fluorescence microscopy. The developed microscope, which employs optimally polarized illumination, provides a point spread function with a single peak.

© 2008 Optical Society of America

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