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Development of a Novel Hyperspectral Darkfield Microscopy System for Characterization of Nanoparticle Sensors

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Abstract

We present a novel hyperspectral darkfield microscopy scheme that utilizes an epi-illumination light train for improved characterization of the sensing capacity of noble metal nanoparticles. Validation experiments are presented to characterize the new system.

© 2008 Optical Society of America

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