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Scattering Characterization of TiO2/Polyurethane Phantom Using Frequency-Domain Optical Imaging

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Abstract

An optical imaging system employing frequency domain photon migration (FDPM) technique is used to characterize the TiO2/polyurethane optical phantoms. A standardized model relating the reduced scattering coefficient and the concentration of TiO2 scatters is derived.

© 2008 Optical Society of America

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