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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
June 1, 2003
ISBN: 1-55752-733-4
THz Imaging (CMP)

Micrometer resolution with (sub)-millimeter waves

Nick C. van der Valk and Paul C. Planken

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No abstract available.

OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.5810) Microscopy : Scanning microscopy

Citation
N. C. van der Valk and P. C. Planken, "Micrometer resolution with (sub)-millimeter waves," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference, Technical Digest (Optical Society of America, 2003), paper CMP2.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2003-CMP2


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