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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
June 1, 2003
ISBN: 1-55752-733-4
Nonlinear High Field Phenomena II (CMZ)

Soft x-ray pulse duration measurement with sub-100-fs resolution using ultrafast resonance absorption change caused by optical-field-induced ionization

Katsuya Oguri, Tsuneyuki Ozaki, Tadashi Nishikawa, and Hidetoshi Nakano

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No abstract available.

OCIS Codes
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7150) Ultrafast optics : Ultrafast spectroscopy

Citation
K. Oguri, T. Ozaki, T. Nishikawa, and H. Nakano, "Soft x-ray pulse duration measurement with sub-100-fs resolution using ultrafast resonance absorption change caused by optical-field-induced ionization," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference, Technical Digest (Optical Society of America, 2003), paper CMZ2.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2003-CMZ2


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