Abstract
Adsorbed molecular contaminants on CaF2 surfaces were analyzed using laser-induced-desorption-time-of-flight mass spectrometer. The desorption thresholds were determined from a degenerate threshold model. The results suggested that contaminants were being removed from surface defects.
© 2003 Optical Society of America
PDF ArticleMore Like This
J. B. Franck and H. A. Macleod
TuC5 Optical Interference Coatings (OIC) 1988
LEE CHEN, V. LIBERMAN, J. A. O’NEILL, and R. M. OSGOOD
WX2 Conference on Lasers and Electro-Optics (CLEO:S&I) 1988
Keith R. Lykke, Peter Wurz, Deborah H. Parker, Jerry E. Hunt, Michael J. Pellin, and Dieter M. Gruen
ThB4 Laser Applications to Chemical Analysis (LACSEA) 1992