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Optica Publishing Group
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference
  • Technical Digest (Optica Publishing Group, 2003),
  • paper CThY5

Analysis of contaminants on CaF2 surfaces by infrared laser induced desorption

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Abstract

Adsorbed molecular contaminants on CaF2 surfaces were analyzed using laser-induced-desorption-time-of-flight mass spectrometer. The desorption thresholds were determined from a degenerate threshold model. The results suggested that contaminants were being removed from surface defects.

© 2003 Optical Society of America

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