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Conference Paper
Conference on Lasers and Electro-Optics
San Francisco, California United States
May 16, 2004
ISBN: 1-55752-770-9
Optical Instrumentation and Microscopy (CThII)

Optical instrumentation for elastic light scattering monitoring of surface and bulk properties

Valeriy A. Sterligov, Pierre Cheyssac, Georges Bossis, and Cyrille Metayer

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Abstract

A new and powerful method for characterization and monitoring of surface and bulk properties has been developed. This method is based on fast, sensitive and accurate measurements of the half-sphere's angular distribution of scattered light.

© 2004 Optical Society of America

OCIS Codes
(290.0290) Scattering : Scattering
(290.5820) Scattering : Scattering measurements
(290.5850) Scattering : Scattering, particles

Citation
V. A. Sterligov, P. Cheyssac, G. Bossis, and C. Metayer, "Optical instrumentation for elastic light scattering monitoring of surface and bulk properties," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2004), paper CThII2.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2004-CThII2


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