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  • Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2004),
  • paper CThJ1

White-Light Continuum Z-scan Technique for Nonlinear Materials Characterization

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Abstract

We present a rapid characterization technique for nonlinear absorption and refraction: the white-light continuum Z-scan. The broadband nature of this pump permits us to measure the two-photon absorption spectrum of ZnSe using only one beam.

© 2004 Optical Society of America

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