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Conference Paper
Conference on Lasers and Electro-Optics
San Francisco, California United States
May 16, 2004
ISBN: 1-55752-770-9
CLEO Poster Session I (CTuP)

A femtosecond laser-activated silicon reflection switch for electron-beam bunch length measurements

Ricardo Ascazubi, Ingrid Wilke, Hua Zhong, Shaohong Wang, Xi Cheng Zhang, Alan Fisher, Paul Bolton, Roger Carr, and Holger Schlarb

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Abstract

We report an experimental study of the reflection of s- and p-polarized subpicosecond THz-radiation pulses from silicon. We propose silicon reflection switches for relativistic femtosecond electron-beam bunch length measurement via THz wake field diagnostics.

© 2004 Optical Society of America

OCIS Codes
(320.0320) Ultrafast optics : Ultrafast optics
(320.2250) Ultrafast optics : Femtosecond phenomena
(320.7100) Ultrafast optics : Ultrafast measurements

Citation
R. Ascazubi, I. Wilke, H. Zhong, S. Wang, X. C. Zhang, A. Fisher, P. Bolton, R. Carr, and H. Schlarb, "A femtosecond laser-activated silicon reflection switch for electron-beam bunch length measurements," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2004), paper CTuP25.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2004-CTuP25


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