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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 22, 2005
ISBN: 1-55752-770-9
Optical Instrumentation (CThT)

IR Optical Scattering Instrument with Out-of-Plane and Retro-Reflection Capabilities

Jinan Zeng, Leonard M. Hanssen, and Raju V. Datla

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Abstract

IR BRDF instrument has been developed at NIST with out-of-plane and retro-reflection capabilities. Instrumental description, novel capabilities and alignment techniques using Q-detector are presented with related results. Results of BRDF in retro-reflection configuration are demonstrated.

© 2005 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.0290) Scattering : Scattering

Citation
J. Zeng, L. M. Hanssen, and R. V. Datla, "IR Optical Scattering Instrument with Out-of-Plane and Retro-Reflection Capabilities," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2005), paper CThT5.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2005-CThT5


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