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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 22, 2005
ISBN: 1-55752-770-9
New Applications of Nonlinear Optics (CTuB)

Second-Harmonic Characterization of Si/Hf(1-x)SixO2 Interfaces

Ramon Carriles, Jinhee Kwon, Yongqiang An, James C. Miller, Michael C. Downer, Jimmy Price, and Alain C. Diebold

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Abstract

We present a Second-Harmonic Generation study of a set of device quality Si/Hf(1-x)SixO2 interfaces for different x values and annealing treatments. Rotationally-anisotropic, spectroscopic and time-dependent SHG depend strongly on dielectric composition and annealing.

© 2005 Optical Society of America

OCIS Codes
(160.0160) Materials : Materials
(160.6000) Materials : Semiconductor materials
(240.0240) Optics at surfaces : Optics at surfaces
(240.4350) Optics at surfaces : Nonlinear optics at surfaces

Citation
R. Carriles, J. Kwon, Y. An, J. C. Miller, M. C. Downer, J. Price, and A. C. Diebold, "Second-Harmonic Characterization of Si/Hf(1-x)SixO2 Interfaces," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2005), paper CTuB4.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2005-CTuB4


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