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Optica Publishing Group
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2005),
  • paper CWF7

3D Analysis of scattering losses due to sidewall roughness in microphotonic waveguides: high index-contrast.

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Abstract

We present a 3D analysis of scattering losses due to sidewall roughness in rectangular dielectric waveguides valid for any refractive-index-contrast and field polarization. We show that the typical 2D analyses can substantially over-estimate scattering losses.

© 2005 Optical Society of America

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