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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 22, 2005
ISBN: 1-55752-770-9
Emerging Microscopy Techniques (CWH)

Combination of AFM with IR-ATR Spectroscopy for Measurements in Liquid Environment

Martin Brucherseifer, Christine Kranz, and Boris Mizaikoff

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Abstract

We present the instrumental combination of atomic force microscopy with infrared attenuated total reflectance spectroscopy. This is the first time to demonstrate AFM scanning while recording IR-spectra in a liquid environment.

© 2005 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(300.0300) Spectroscopy : Spectroscopy
(300.6340) Spectroscopy : Spectroscopy, infrared

Citation
M. Brucherseifer, C. Kranz, and B. Mizaikoff, "Combination of AFM with IR-ATR Spectroscopy for Measurements in Liquid Environment," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2005), paper CWH2.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2005-CWH2


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