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Conference Paper
Conference on Lasers and Electro-Optics
Long Beach, California United States
May 21, 2006
ISBN: 1-55752-813-6
Silicon Photonics (CFI)

Loss Characterization and Surface Passivation in Silicon Microphotonics

Matthew Borselli, Thomas J. Johnson, and Oskar Painter

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Abstract

High-quality factor (Q>10^6) microresonators are used to probe the optical properties of silicon-on-insulator surfaces with 0.04% monolayer sensitivity. A rapid and accurate measurement of linear and nonlinear absorption is utilized to assess new surface-passivation techniques.

© 2006 Optical Society of America

OCIS Codes
(230.0230) Optical devices : Optical devices
(230.5750) Optical devices : Resonators
(240.0240) Optics at surfaces : Optics at surfaces
(240.6700) Optics at surfaces : Surfaces

Citation
M. Borselli, T. J. Johnson, and O. Painter, "Loss Characterization and Surface Passivation in Silicon Microphotonics," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper CFI4.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2006-CFI4


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