High-quality factor (Q>10^6) microresonators are used to probe the optical properties of silicon-on-insulator surfaces with 0.04% monolayer sensitivity. A rapid and accurate measurement of linear and nonlinear absorption is utilized to assess new surface-passivation techniques.
© 2006 Optical Society of America
M. Borselli, T. J. Johnson, and O. Painter, "Loss Characterization and Surface Passivation in Silicon Microphotonics," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper CFI4.
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