We propose a laser-frequency-based scale free from dispersive effects using a widely tunable laser and an optical frequency comb generator. We achieved displacement ranges up to 10µm with 220pm uncertainty for measurement periods of 600s.
© 2006 Optical Society of America
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
Y. Bitou, "Dispersion-Free Wide-Range Sub-nm Scale Using Tunable Diode Laser and Optical Frequency Comb Generator," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper CMY6.
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