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Conference Paper
Conference on Lasers and Electro-Optics
Long Beach, California United States
May 21, 2006
ISBN: 1-55752-813-6
Low Dimensional Semiconductors (CThB)

Measurement of the Lifetimes of Photo-Excited Carriers in Type-I and Type-II Quantum Well Materials

Guoyun Ru, Fow-Sen Choa, Xing Wei, Gang Chen, and Jacob B. Khurgin

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Abstract

Room temperature carrier lifetimes of both type-I and type-II InP-based multiple quantum wells near optical transparency were measured using the pump-probe technique. Longer carrier lifetime in the type-II sample was observed.

© 2006 Optical Society of America

OCIS Codes
(060.0060) Fiber optics and optical communications : Fiber optics and optical communications
(060.4510) Fiber optics and optical communications : Optical communications
(250.0250) Optoelectronics : Optoelectronics
(250.5980) Optoelectronics : Semiconductor optical amplifiers

Citation
G. Ru, F. Choa, X. Wei, G. Chen, and J. B. Khurgin, "Measurement of the Lifetimes of Photo-Excited Carriers in Type-I and Type-II Quantum Well Materials," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper CThB3.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2006-CThB3


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