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Conference Paper
Conference on Lasers and Electro-Optics
Long Beach, California United States
May 21, 2006
ISBN: 1-55752-813-6
Waveguide Devices (CThBB)

Characterization of a 90° Waveguide Bend Using Near-field Scanning Optical Microscopy

Guangwei Yuan, Matthew Stephens, David Dandy, and Kevin Lear

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Abstract

Multiple modes are directly imaged in a silicon nitride waveguide bend using near-field scanning optical microscopy (NSOM). The observations are in good agreement with modal calculations using conformal index transformation.

© 2006 Optical Society of America

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(130.1750) Integrated optics : Components
(230.0230) Optical devices : Optical devices
(230.7390) Optical devices : Waveguides, planar

Citation
G. Yuan, M. Stephens, D. Dandy, and K. Lear, "Characterization of a 90° Waveguide Bend Using Near-field Scanning Optical Microscopy," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper CThBB6.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2006-CThBB6


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