OSA's Digital Library

Optics InfoBase > Conference Papers > CLEO > 2006 > CThBB > Page CThBB6 © 2006 OSA

Conference Paper
Conference on Lasers and Electro-Optics
Long Beach, California United States
May 21, 2006
ISBN: 1-55752-813-6
Waveguide Devices (CThBB)

Characterization of a 90° Waveguide Bend Using Near-field Scanning Optical Microscopy

Guangwei Yuan, Matthew Stephens, David Dandy, and Kevin Lear

View Full Text Article

Acrobat PDF (383 KB) Note that full-text PDFs from conferences typically contain 1-3 pages of content, some or all of which might be an abstract, summary, or miscellaneous items.

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

  • Export Citation/Save Click for help


Multiple modes are directly imaged in a silicon nitride waveguide bend using near-field scanning optical microscopy (NSOM). The observations are in good agreement with modal calculations using conformal index transformation.

© 2006 Optical Society of America

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(130.1750) Integrated optics : Components
(230.0230) Optical devices : Optical devices
(230.7390) Optical devices : Waveguides, planar

G. Yuan, M. Stephens, D. Dandy, and K. Lear, "Characterization of a 90° Waveguide Bend Using Near-field Scanning Optical Microscopy," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper CThBB6.

Sort:  Journal  |  Reset


References are not available for this paper.

OSA is a member of CrossRef.

CrossCheck Deposited