Multiple modes are directly imaged in a silicon nitride waveguide bend using near-field scanning optical microscopy (NSOM). The observations are in good agreement with modal calculations using conformal index transformation.
© 2006 Optical Society of America
G. Yuan, M. Stephens, D. Dandy, and K. Lear, "Characterization of a 90° Waveguide Bend Using Near-field Scanning Optical Microscopy," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper CThBB6.
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