Design modifications to InP-based Geiger-mode avalanche photodiodes are described that improve reliability. Geiger-mode aging at multiple conditions can cause significant degradation in some design variants while linear mode (below breakdown) aging does not.
© 2006 Optical Society of America
G. M. Smith, J. P. Donnelly, K. A. McIntosh, E. K. Duerr, C. J. Vineis, D. C. Shaver, S. Verghese, J. E. Funk, J. M. Mahan, P. I. Hopman, L. J. Mahoney, K. M. Molvar, F. J. O'Donnell, D. C. Oakley, and K. G. Ray, "Design and Reliability of Mesa-Etched InP-based Geiger-Mode Avalanche Photodiodes," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper CThD7.
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