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  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2006),
  • paper CTuM1

Thermal Profiling of Photonic Integrated Circuits by Thermoreflectance Microscopy

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Abstract

We demonstrate the use of thermoreflectance imaging for wafer-scale testing of photonic integrated circuits. The technique is used to identify damaged devices in a dysfunctional photonic circuit comprised of cascaded semiconductor optical amplifiers.

© 2006 Optical Society of America

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