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Conference Paper
Conference on Lasers and Electro-Optics
Long Beach, California United States
May 21, 2006
ISBN: 1-55752-813-6
Attosecond and XUV Spectroscopy (JFB)

Time-Resolved X-ray Absorption Spectroscopy at the Silicon L- and K-Edge with 20 fs Resolution

Eniko Seres and Christian Spielmann

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Abstract

We report a measurement of the modification of the x-ray absorption spectrum near the L and K edges of Silicon after excitation with near IR pulses. The estimated temporal resolution is better than 20 fs.

© 2006 Optical Society of America

OCIS Codes
(300.0300) Spectroscopy : Spectroscopy
(300.6560) Spectroscopy : Spectroscopy, x-ray
(320.0320) Ultrafast optics : Ultrafast optics
(320.7150) Ultrafast optics : Ultrafast spectroscopy

Citation
E. Seres and C. Spielmann, "Time-Resolved X-ray Absorption Spectroscopy at the Silicon L- and K-Edge with 20 fs Resolution," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper JFB3.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2006-JFB3


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