Tightly focused ultrashort-pulse light efficiently drives a hard x-ray source (η=0.08%) with 9-µm size enabling imaging of small features using indigenous electrons in Mo and Au/Si. In-plane and out-of-plane angular distribution of x-rays is measured.
© 2006 Optical Society of America
(340.0340) X-ray optics : X-ray optics
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)
(350.0350) Other areas of optics : Other areas of optics
(350.5400) Other areas of optics : Plasmas
B. Hou, A. Mordovanakis, A. Krol, J. Kieffer, G. Mourou, and J. Nees, "Characterization of a Minute Hard X-ray Source Driven by a Relativistic Wavelength-Cubed Laser," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2006), paper JThB6.