Large-Angle, Low-Voltage Electro-Optic Beam Scanner by Kerr Effect and Space-Charge-Controlled Electrical Conduction in KTa1−xNbxO3

Koichiro Nakamura; Jun Miyazu; Masahiro Sasaura; Kazuo Fujiura

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
OSA Technical Digest Series (CD) (Optica Publishing Group, 2007),
paper CMGG1

Large-Angle, Low-Voltage Electro-Optic Beam Scanner by Kerr Effect and Space-Charge-Controlled Electrical Conduction in KTa₁₋_xNb_xO₃

Koichiro Nakamura, Jun Miyazu, Masahiro Sasaura, and Kazuo Fujiura

Conference on Lasers and Electro-Optics 2007

Baltimore, Maryland United States
6–11 May 2007
ISBN: 1557528349

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Electro-Optic and Nonlinear Optic Materials (CMGG)

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K. Nakamura, J. Miyazu, M. Sasaura, and K. Fujiura, "Large-Angle, Low-Voltage Electro-Optic Beam Scanner by Kerr Effect and Space-Charge-Controlled Electrical Conduction in KTa1−xNbxO3," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest Series (CD) (Optica Publishing Group, 2007), paper CMGG1.

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Abstract

An electro-optic beam scanner with an unprecedented performance is demonstrated. Full deflection angle of 14.3° has been achieved by applying only ±250 V to 0.5-mm-thick KTa₁₋_xNb_xO₃ crystal with an interaction length of 5.0 mm.

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