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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 6, 2007
ISBN: 1557528349
Optical Interferometry (CTuT)

Real-Time Optical Frequency-Domain Reflectometry

Yongwoo Park, Tae-Jung Ahn, Jose Azaña, and Jean-Claude Kieffer

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Abstract

We propose and demonstrate an ultrafast optical frequency domain reflectometry based on real-time optical Fourier-transformation. Interferograms are captured over 50 ns time windows at a 20 MHz repetition rate with a 70 μm depth resolution.

© 2007 OSA

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(070.2590) Fourier optics and signal processing : ABCD transforms
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry

Citation
Y. Park, T. Ahn, J. Azaña, and J. Kieffer, "Real-Time Optical Frequency-Domain Reflectometry," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest Series (CD) (Optical Society of America, 2007), paper CTuT1.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2007-CTuT1


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