Characterization of High-Frequency Surface Modulation Using the Transport-of-Intensity Equation

C. Dorrer; J. D. Zuegel

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
OSA Technical Digest Series (CD) (Optica Publishing Group, 2007),
paper CTuT6

Characterization of High-Frequency Surface Modulation Using the Transport-of-Intensity Equation

C. Dorrer and J. D. Zuegel

Conference on Lasers and Electro-Optics 2007

Baltimore, Maryland United States
6–11 May 2007
ISBN: 1557528349

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Optical Interferometry (CTuT)

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C. Dorrer and J. D. Zuegel, "Characterization of High-Frequency Surface Modulation Using the Transport-of-Intensity Equation," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest Series (CD) (Optica Publishing Group, 2007), paper CTuT6.

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Abstract

The transport-of-intensity equation is used to describe the influence of small-scale phase fluctuations present on the surface of optical elements, which can be characterized from the diffraction-induced modifications of the intensity of a coherent source.

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