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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 6, 2007
ISBN: 1557528349
Optical Interferometry (CTuT)

Characterization of High-Frequency Surface Modulation Using the Transport-of-Intensity Equation

Christophe Dorrer and Jonathan D. Zuegel

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Abstract

The transport-of-intensity equation is used to describe the influence of small-scale phase fluctuations present on the surface of optical elements, which can be characterized from the diffraction-induced modifications of the intensity of a coherent source.

© 2007 OSA

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

Citation
C. Dorrer and J. D. Zuegel, "Characterization of High-Frequency Surface Modulation Using the Transport-of-Intensity Equation," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest Series (CD) (Optical Society of America, 2007), paper CTuT6.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2007-CTuT6

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