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Conferences > CLEO > 2007 > CTuV > CTuV1
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • OSA Technical Digest Series (CD) (Optica Publishing Group, 2007),
  • paper CTuV1

The Role of Amplitude and Phase in Fluorescence Coherence Imaging: From Wide Field to Nanometer Depth Profiling

A. Bilenca, C. Joo, A. Ozcan, J. F. de Boer, B. Bouma, and G. Tearney

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Abstract

We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.

© 2007 Optical Society of America

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