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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 6, 2007
ISBN: 1557528349
Poster Session III (JThD)

Tip-to-Sample Distance Control in Apertureless Near-Field Optical Microscopy

Alexander A. Milner, Kaiyin Zhang, and Yehiam Prior

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Abstract

Novel mode of AFM operation is proposed providing the small, few nanometers tip to sample gap, appropriate for the ANSOM experiments. A set-up open for the run-time adjustments, working at ambient conditions is considered.

© 2007 OSA

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(240.0240) Optics at surfaces : Optics at surfaces
(240.4350) Optics at surfaces : Nonlinear optics at surfaces

Citation
A. A. Milner, K. Zhang, and Y. Prior, "Tip-to-Sample Distance Control in Apertureless Near-Field Optical Microscopy," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest Series (CD) (Optical Society of America, 2007), paper JThD108.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2007-JThD108


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