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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 6, 2007
ISBN: 1557528349
Poster Session III (JThD)

Photonic Force Microscopy with Back-Scattered Light

Giovanni Volpe, Gregory Kozyreff, and Dmitri Petrov

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Abstract

We compare the sensitivity of the Photonic Force Microscope for the forward-scattering and backward-scattering geometries, calculating the total-scattered electromagnetic field from a dielectric bead in an optical trap using a Mie-Debye approach.

© 2007 OSA

OCIS Codes
(140.0140) Lasers and laser optics : Lasers and laser optics
(140.7010) Lasers and laser optics : Laser trapping
(170.0170) Medical optics and biotechnology : Medical optics and biotechnology
(170.4520) Medical optics and biotechnology : Optical confinement and manipulation

Citation
G. Volpe, G. Kozyreff, and D. Petrov, "Photonic Force Microscopy with Back-Scattered Light," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest Series (CD) (Optical Society of America, 2007), paper JThD96.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2007-JThD96


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