We demonstrate the use of amplified spontaneous emission in thermoreflectance imaging of photonic integrated circuits for fiber-free characterization of the integrated cascaded semiconductor optical amplifiers.
© 2007 OSA
M. Farzaneh, J. A. Hudgings, and R. J. Ram, "Fiber-Free Characterization of Photonics Integrated Circuits by Thermoreflectance Microscopy," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest Series (CD) (Optical Society of America, 2007), paper JTuA40.
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