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Conference Paper
Conference on Lasers and Electro-Optics
San Jose, California United States
May 4-9, 2008
ISBN: 978-1-55752-859-9
Superresolution Imaging (CFT)

Depletion Dynamics for Stimulated Emission Depletion (STED) Microscopy

Margaret C. Chiang, Juan C. Garcia, and Jia-Ming Liu

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Abstract

We present preliminary experimental data revealing depletion dynamics for stimulated emission depletion (STED) microscopy as a function of excitation intensity, depletion intensity, time delay, and fluorophore damage. FluoSpheres 350/440 (Invitrogen) is used.

© 2008 Optical Society of America

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(180.0180) Microscopy : Microscopy
(180.2520) Microscopy : Fluorescence microscopy

Citation
M. C. Chiang, J. C. Garcia, and J. Liu, "Depletion Dynamics for Stimulated Emission Depletion (STED) Microscopy," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest (CD) (Optical Society of America, 2008), paper CFT4.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2008-CFT4


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