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Conference Paper
Conference on Lasers and Electro-Optics
San Jose, California United States
May 4-9, 2008
ISBN: 978-1-55752-859-9
Advanced Optical Length Metrology (CMEE)

High-Accuracy Interferometer with a Prism Pair for Measurement of the Absolute Refractive Index of Glass

Yasuaki Hori, Akiko Hirai, Kaoru Minoshima, and Hirokazu Matsumoto

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Abstract

Interferometer for precise refractive-index measurement of glass-prism without prior knowledge is developed using a direct comparison of optical-path-changes in glass and air. Preliminary result shows uncertainty of 4.4 × 10<sup>-5</sup>agreeing with the manufacturer’s values.

© 2008 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(160.0160) Materials : Materials
(160.4760) Materials : Optical properties

Citation
Y. Hori, A. Hirai, K. Minoshima, and H. Matsumoto, "High-Accuracy Interferometer with a Prism Pair for Measurement of the Absolute Refractive Index of Glass," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest (CD) (Optical Society of America, 2008), paper CMEE2.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2008-CMEE2


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