Nanoscale Heat Transport Probed with Soft-X-Rays

Mark Siemens; Qing Li; Margaret Murnane; Henry Kapteyn; Ronggui Yang; Keith Nelson

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
OSA Technical Digest (CD) (Optica Publishing Group, 2008),
paper CWA6

Nanoscale Heat Transport Probed with Soft-X-Rays

Mark Siemens, Qing Li, Margaret Murnane, Henry Kapteyn, Ronggui Yang, and Keith Nelson

Conference on Lasers and Electro-Optics 2008

San Jose, California United States
4–9 May 2008
ISBN: 978-1-55752-859-9

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Ultrafast Spectroscopy and Dynamics (CWA)

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M. Siemens, Q. Li, M. Murnane, H. Kapteyn, R. Yang, and K. Nelson, "Nanoscale Heat Transport Probed with Soft-X-Rays," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest (CD) (Optica Publishing Group, 2008), paper CWA6.

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Abstract

We characterize heat transport in nanostructures, using coherent soft-x-rays to probe thermal surface deformation. By varying the substrate temperature, we observe the transition from diffusive to quasi-ballistic heat transport regimes.

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