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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 31, 2009 - June 5, 2009
ISBN: 978-1-55752-869-8
Ultraviolet and Blue Light Emitters (CMEE)

Reliability of Deep UV LEDs

Max Shatalov, Yuri Bilenko, Remis Gaska, Sergey Rumyantsev, and Michael Shur


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We report on reliability of deep UV LEDs with wavelengths ranging from 235 to 310 nm. The current-voltage characteristics and the spectrum remain nearly unchanged, relating degradation mechanisms to the p-cladding layers and p-type contacts.

© 2009 The Optical Society

OCIS Codes
(230.0230) Optical devices : Optical devices
(230.3670) Optical devices : Light-emitting diodes
(230.4170) Optical devices : Multilayers

M. Shatalov, Y. Bilenko, R. Gaska, S. Rumyantsev, and M. Shur, "Reliability of Deep UV LEDs," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference, OSA Technical Digest (CD) (Optical Society of America, 2009), paper CMEE3.

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