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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 31, 2009 - June 5, 2009
ISBN: 978-1-55752-869-8
Novel 2-D and 3-D Microscopy (CTuAA)

Imaging Interferometric Nanoscopy to the Limit of Available Frequency Space

Yuliya V. Kuznetsova, Alexander Neumann, and S.r.j. Brueck

http://dx.doi.org/10.1364/CLEO.2009.CTuAA5


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Abstract

Imaging interferometric microscopy resolution to λ/2(n<sup>sub</sup>+1) (n<sup>sub</sup> <sup/>= substrate refractive index) is demonstrated using evanescent-wave illumination. Resolution to 150 nm (λ/4.2) is achieved using a 633 nm source and a 0.4 NA lens.

© 2009 The Optical Society

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(180.0180) Microscopy : Microscopy
(180.3170) Microscopy : Interference microscopy
(110.3175) Imaging systems : Interferometric imaging

Citation
Y. V. Kuznetsova, A. Neumann, and S. r. j. Brueck, "Imaging Interferometric Nanoscopy to the Limit of Available Frequency Space," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference, OSA Technical Digest (CD) (Optical Society of America, 2009), paper CTuAA5.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2009-CTuAA5


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