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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 31, 2009 - June 5, 2009
ISBN: 978-1-55752-869-8
Limitations and Noise in Optical Metrology (CTuB)

Entanglement for Metrology with Atomic Ensembles

Eugene Polzik

http://dx.doi.org/10.1364/CLEO.2009.CTuB1


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Abstract

This tutorial will cover the reduction of the quantum projection noise in large atomic ensembles via entanglement and its applications for clocks and metrology.

© 2009 The Optical Society

OCIS Codes
(270.0270) Quantum optics : Quantum optics
(270.2500) Quantum optics : Fluctuations, relaxations, and noise
(270.5585) Quantum optics : Quantum information and processing

Citation
E. Polzik, "Entanglement for Metrology with Atomic Ensembles," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference, OSA Technical Digest (CD) (Optical Society of America, 2009), paper CTuB1.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2009-CTuB1

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