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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 31, 2009 - June 5, 2009
ISBN: 978-1-55752-869-8
THz Imaging (CWM)

Mode Imaging and Dispersion Analysis in Terahertz Waveguides Using Terahertz Near-Field Microscopy

Oleg Mitrofanov, Thomas Tan, Paul R. Mark, Bradley Bowden, and James A. Harrington

http://dx.doi.org/10.1364/CLEO.2009.CWM1


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Abstract

Mode structure, transmission loss and dispersion are characterized in low-loss (~1dB/m) Terahertz (THz) dielectric-lined hollow metallic waveguides. THz near-field probe imaging and spectroscopy is applied for precise mode imaging and selective mode probing.

© 2009 The Optical Society

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(230.0230) Optical devices : Optical devices
(230.7370) Optical devices : Waveguides
(110.6795) Imaging systems : Terahertz imaging

Citation
O. Mitrofanov, T. Tan, P. R. Mark, B. Bowden, and J. A. Harrington, "Mode Imaging and Dispersion Analysis in Terahertz Waveguides Using Terahertz Near-Field Microscopy," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference, OSA Technical Digest (CD) (Optical Society of America, 2009), paper CWM1.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2009-CWM1


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