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Conference Paper
Conference on Lasers and Electro-Optics
Baltimore, Maryland United States
May 31, 2009 - June 5, 2009
ISBN: 978-1-55752-869-8
Joint CLEO Poster Session III (JThE)

Enhanced Resolution in Two-Photon Imaging Using a TM<sup>01</sup>Laser Beam

Harold Dehez, Michel Piché, and Yves De Koninck

http://dx.doi.org/10.1364/CLEO.2009.JThE62


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Abstract

We demonstrate experimentally that the resolution of a two-photon microscope is improved by a factor of 1.7 by using a TM<sup>01</sup>laser beam and a plane interface between dielectrics instead of a Gaussian beam.

© 2009 The Optical Society

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(350.0350) Other areas of optics : Other areas of optics
(350.5730) Other areas of optics : Resolution

Citation
H. Dehez, M. Piché, and Y. De Koninck, "Enhanced Resolution in Two-Photon Imaging Using a TM<sup>01</sup>Laser Beam," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference, OSA Technical Digest (CD) (Optical Society of America, 2009), paper JThE62.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO-2009-JThE62


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