Near-field microscopy of thermal radiation

Yusuke Kajihara; Yusuke Kajihara; Susumu Komiyama; Keishi Kosaka

doi:10.1364/CLEO.2010.CWO6

Conference on Lasers and Electro-Optics 2010
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper CWO6
•https://doi.org/10.1364/CLEO.2010.CWO6

Near-field microscopy of thermal radiation

Yusuke Kajihara, Susumu Komiyama, and Keishi Kosaka

Conference on Lasers and Electro-Optics 2010

San Jose, California United States
16–21 May 2010
ISBN: 978-1-55752-889-6

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THz Imaging (CWO)

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Y. Kajihara, S. Komiyama, and K. Kosaka, "Near-field microscopy of thermal radiation," in Conference on Lasers and Electro-Optics 2010, OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper CWO6.

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Abstract

We have developed a scattering-type scanning near-field optical microscope with a charge sensitive infrared phototransistor. Near-field images of spontaneously emitted thermal radiation were clearly obtained and the spatial resolution was better than 300 nm.

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