Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > CLEO > 2010 > JWA > JWA42

Measurement of the FSR of a high finesse etalon with 2.5 kHz accuracy using a narrow-linewidth frequency swept laser

D. Mandridis, M. Bagnell, I. Ozdur, and P. J. Delfyett

Not Accessible

Your library or personal account may give you access

Abstract

Measurement of the FSR of an etalon having finesse of 1000 with 7 digits of accuracy or 2.5 kHz. A modified PDH technique is used in conjunction with a frequency swept, narrow-linewidth CW laser.

© 2010 Optical Society of America

PDF Article
More Like This
2.5-kHz Linewidth, Single-Frequency and Polarization-Stable Fiber Fabry-Perot Laser using a Non-Polarization-Maintaining Fiber and an Intracavity Etalon

Y. Takushima, S. Yamashita, K. Kikuchi, and K. Hotate
16C2.2 Optoelectronics and Communications Conference (OECC) 1996

Optical Frequency Stability Measurement based on an Etalon Reference

Ibrahim Ozdur, Mohammad U. Piracha, Mehmetcan Akbulut, Nazanin Hoghooghi, Dimitrios Mandridis, and Peter J. Delfyett
JWA33 Conference on Lasers and Electro-Optics (CLEO:S&I) 2010

Single-frequency narrow-linewidth 2μm fiber laser using Tm-doped silicate glass fiber

Jihong Geng, Qing Wang, Tao Luo, Shibin Jiang, and Farzin Amzajerdian
AMC1 Advanced Solid-State Photonics (ASSL) 2010

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use