We proposed a near-infrared nano-imaging spectroscopy of semiconductor quantum structures using a phase change mask layer. The performance of this method was demonstrated by numerical simulation and photoluminescence measurement of quantum dots.
© 2011 OSA
N. Tsumori, M. Takahashi, and T. Saiki, "Near-infrared Nano-imaging Spectroscopy of Semiconductor Quantum Dots using a Phase Change Mask Layer," in CLEO:2011 - Laser Applications to Photonic Applications, OSA Technical Digest (CD) (Optical Society of America, 2011), paper JTuI60.
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