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Conference Paper
CLEO: Applications and Technology
Baltimore, Maryland United States
May 1-6, 2011
ISBN: 978-1-55752-910-7
Nanophotonics and Integration Joint Poster Session (JTuI)

Near-infrared Nano-imaging Spectroscopy of Semiconductor Quantum Dots using a Phase Change Mask Layer

Nobuhiro Tsumori, Motoki Takahashi, and Toshiharu Saiki  »View Author Affiliations


http://dx.doi.org/10.1364/CLEO_AT.2011.JTuI60


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Abstract

We proposed a near-infrared nano-imaging spectroscopy of semiconductor quantum structures using a phase change mask layer. The performance of this method was demonstrated by numerical simulation and photoluminescence measurement of quantum dots.

© 2011 OSA

OCIS Codes
(230.5590) Optical devices : Quantum-well, -wire and -dot devices
(300.6340) Spectroscopy : Spectroscopy, infrared
(180.4243) Microscopy : Near-field microscopy

Citation
N. Tsumori, M. Takahashi, and T. Saiki, "Near-infrared Nano-imaging Spectroscopy of Semiconductor Quantum Dots using a Phase Change Mask Layer," in CLEO:2011 - Laser Applications to Photonic Applications, OSA Technical Digest (CD) (Optical Society of America, 2011), paper JTuI60.
http://www.opticsinfobase.org/abstract.cfm?URI=CLEO_AT-2011-JTuI60


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